Kyu Seok Kim, Yu Jin Kim, Dae Yeon Cho, and Il-Chul Moon, Detection of Defect Cause Analysis with Production Pathway, International Meeting on Information Display (IMID 2020), Seoul, South Korea, 2020 

@inproceedings{Kim2020,
address = {Seoul, Korea},
author = {Kim, K, S., Kim, Y. J., Cho, D. Y., and Moon, I.C.},
booktitle = {International Meeting on Information Display (IMID 2020)},
title = {{Detection of Defect Cause Analysis with Production Pathway}},
year = {2020}
}